To shorten the wait for the 14th ThGOT and the 6th Optics Colloquium we would like to give you a small foretaste of our numerous exciting technical presentations in the coming weeks.
Specular reflectance and scattered light losses of aluminum coatings in the UV.
Sven Stempfhuber / Fraunhofer Institute for Applied Optics and Precision Engineering (IOF) - Optical Systems, Jena
Aluminum has a high reflectivity of approx. 90% up to the UV spectral range. For shorter wavelengths, however, the coating roughness represents a negative factor influencing the reflection. The influence of different process parameters during coating deposition on the achievable roughness of the aluminum coating is shown. The coatings prepared under different process parameters were characterized in terms of growth and topography. Scattered light measurements were used to describe the influence of roughness on scattered light losses.
Aluminum has a high reflectivity of approx. 90% up to the UV spectral range. For shorter wavelengths, however, the coating roughness represents a negative factor influencing the reflection. The influence of different process parameters during coating deposition on the achievable roughness of the aluminum coating is shown. The coatings prepared under different process parameters were characterized in terms of growth and topography. Scattered light measurements were used to describe the influence of roughness on scattered light losses.
This talk will be presented on 03/14/2019 at 12:15 pm in the 6th Colloquium Thin Films in Optics
Holography and shrinkage measuring cell - validation of adhesive curing for optics
Dr. Annett Hartmann / INNOVENT e. V. - Analytics and Materials Testing, Jena
Based on the shrinkage measuring cell developed at INNOVENT for investigating the curing behavior of adhesives and using holographic interferometry, deformations in bonded joints can be measured.
The aim is to use these measurement data to develop simpler material models for adhesives in order to be able to map the effect of curing on the bonded joint in the numerical simulation.
In addition to simulation, the curing behavior of adhesives can be investigated more intensively and in a more application-oriented manner via the shrinkage modulus characteristic curve. Both isothermal curing (e.g. at room temperature) and almost any temperature profile can be used in the shrinkage measuring cell to investigate the curing processes of adhesives.
Holographic interferometry allows the determination of substrate surface deformations during the curing process in the range of a few micrometers and can be used as a new method for adhesive selection.
This talk will be presented on 03/14/2019 at 16:45 in the 6th Colloquium Thin Films in Optics