To shorten the wait for the 14th ThGOT and the 6th Optics Colloquium we would like to give you a small foretaste of our numerous exciting technical presentations in the coming weeks.
Development of a parallelizable QCM-D biosensor array w. flexible sample routing
Siegfried Hohmann / Karlsruhe Institute of Technology (KIT) - Institute for Functional Interfaces (IFG), Eggenstein-Leopoldshafen, Germany
Quartz crystal microbalances with dissipation monitoring (QCM-Ds) allow the monitoring of the adsorption process of mass from a liquid to their surface. The chip surface can be modified in a wide range. This allows to study unspecific as well as specific adsorption after the immobilization of capture molecules. The adsorbed mass can be analyzed regarding its contents after the measurement of the adsorption process. To ensure the identification of the adsorbed substances the results of several measurements can be combined. A high content QCM-D biosensor array allowing up to ten measurements in parallel was developed. The samples can be routed inside the array distributing one sample to several chips with different surfaces. The fluidic parts were prototyped using 3D printing. The sample routing function using printed valves could be demonstrated. A temperature controller was developed, implemented and shown to be able to keep the temperature constant over long time with high accuracy.
This talk will be presented in SESSION C: NEW MEASUREMENT METHODS IN SURFACE ENGINEERING on March 13, 2019 at 2:10 pm.
Plasma-based process control in the deposition of interference optics.
Dr. Rüdiger Foest / Leibniz Institute for Plasma Science and Technology, Greifswald
Plasma ion assisted deposition (PIAD) is one of the common manufacturing processes for interference optics. By means of dielectric layer systems, demanding specifications (highly reflective mirrors, antireflection coating, filters) can be realized in many application areas such as ophthalmics, laser optics (material processing, metrology, medical technology, communication technology). In the PIAD process, the coating materials are typically deposited onto the substrates by electron beam evaporation, while the layer growth is supported by an additional plasma beam source.
In this paper, the methods for process-suitable diagnostics of the coating processes are presented. By means of optical emission spectroscopy and active plasma resonance spectroscopy, variations of the plasma state can be detected, drifts can be compensated and thus a new quality of process control can be achieved compared to conventional concepts.
This talk will be presented in SESSION C: NEW MEASUREMENT METHODS IN SURFACE ENGINEERING on March 13, 2019 at 3:00 pm.