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6th Colloquium Thin Films in Optics Part 3

To shorten the wait for the 14th ThGOT and the 6th Optics Colloquium we would like to give you a small foretaste of our numerous exciting technical presentations in the coming weeks.


SIO X-Ray: Get a glimpse into the material through contact experiments
Nick Bierwisch / SIO - Software Development, Nordhausen


Nowadays, the materials and material combinations used are becoming increasingly complex in all fields of application (e.g. optical or automotive industry, aircraft construction or extreme sports). These complex structures are needed to increase the lifetime and performance of the components. The applications require improvements in every aspect of such a material.

However, advanced analysis and optimization methods are required for such increases. Engineering knowledge and rules of thumb are no longer enough. Accurate characterization and optimization of such structures require invertible mathematical tools with a holistic character. SIO has developed analytical models for this purpose, which accelerate the simulation of complex contact situations extremely compared to FEM systems.


This talk will be presented on 14.03.2019 at 14:30 in the 6th Colloquium Thin Films in Optics


Two- and Three-Dimensional Analysis of Optical Materials on the Nanoscale
Christian Patzig / Fraunhofer Institute for Microstructure of Materials and Systems IMWS - Optical Materials and Technologies, Halle, Germany


Nowadays, the function of many optical materials and devices critically relies on the precise control of the micro- and nanostructure of either the material itself, e.g. for glass-ceramics that consist of a glassy matrix with embedded, nanoscopic crystals, or the functionalized surface thereof, e.g. for highly reflective laser mirrors that consist of thin-film multilayer based structures such as alternating high-and low refractive index materials with layer thicknesses in the nanometer range.

The ever-increasing requirements for such optical materials and components, including the homogeneous size distribution of crystalline phases within a glass-ceramic, or the contamination-free, large scale deposition of alternating thin films with thicknesses of a few monolayers only, pose new challenges to the analysis techniques used to get detailed insights into the nanostructure of these materials.

For two different classes of optical materials and systems, it will be shown how state-of-the-art nanoanalytics can be used to answer questions related to size and thickness, homogeneity, purity, crystallinity, and even the three-dimensional distribution of particles within a matrix: for effect-pigment coatings that are used for specialized, sparkling var-nishes, as well as for next-generation EUV-reflecting devices based on ultrathin multilayer stacks of LaN and B4C.


This talk will be presented on 03/14/2019 at 2:45 pm in the 6th Colloquium Thin Films in Optics